Identification of seed sources and parents of Pinus sylvestris L. using visible-near infrared reflectance spectra and multivariate analysis

Trees - Structure and Function

Volumn 19, Issue 4, 2005, Pages 468-476

  Tigabu, Mulualem ^a   Oden, Per Christer ^a   Lindgren, Dag ^a  

^a SWEDISH UNIVERSITY OF AGRICULTURAL SCIENCES   (Sweden)

Author keywords

Genetics; NIR spectroscopy; Provenance; Scots pine; Seed quality

Indexed keywords

GENES; INFRARED SPECTROMETERS; INFRARED SPECTROSCOPY; LEAST SQUARES APPROXIMATIONS; LIGHT REFLECTION; NONDESTRUCTIVE EXAMINATION; SEED;

NEAR INFRARED (NIR) SPECTROSCOPY; PARTIAL LEAST SQUARES-DISCRIMINANT ANALYSIS (PLS-DA); SOFT INDEPENDENT MODELING OF CLASS ANALOGY (SIMCA); VISIBLE (VIS) SPECTROSCOPY;

FORESTRY;

GENOTYPES; INFRARED SPECTROSCOPY; NONDESTRUCTIVE TESTS; PINUS SYLVESTRIS; SEEDS; SPECTROMETERS; TREES;

PINUS SYLVESTRIS;

EID: 21544467001     PISSN: 09311890     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00468-005-0408-5     Document Type: Article

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