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Volumn 7, Issue , 2005, Pages
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Quantitative ellipsometric microscopy at the glass-water interface
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Author keywords
[No Author keywords available]
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Indexed keywords
ELLIPSOMETRIC MICROSCOPY;
FILM THICKNESS;
GLASS-WATER INTERFACE;
ELLIPSOMETRY;
GLASS;
LIGHT REFLECTION;
POLARIZATION;
REFRACTIVE INDEX;
SILICON;
SOLUTIONS;
THIN FILMS;
MICROSCOPIC EXAMINATION;
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EID: 21244441946
PISSN: 13672630
EISSN: 13672630
Source Type: Journal
DOI: 10.1088/1367-2630/7/1/128 Document Type: Article |
Times cited : (4)
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References (33)
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