Microinterferometry: Three-dimensional reconstruction of surface microtopography for thin-film and wetting studies by reflection interference contrast microscopy (RICM)

Applied Optics

Volumn 37, Issue 29, 1998, Pages 6892-6905

  Wiegand, Gerald ^a   Neumaier, Klaus R ^a   Sackmann, Erich ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; IMAGE RECONSTRUCTION; INTERFACES (MATERIALS); LIGHTING; MICROSCOPIC EXAMINATION; THIN FILMS; THREE DIMENSIONAL;

MICROINTERFEROMETRY; REFLECTION INTERFERENCE CONTRAST MICROSCOPY; SURFACE MICROTOPOGRAPHY; THREE DIMENSIONAL RECONSTRUCTION;

INTERFEROMETRY;

EID: 0032505378     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.006892     Document Type: Article

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