Description of a single modular optical setup for ellipsometry, surface plasmons, waveguide modes, and their corresponding imaging techniques including Brewster angle microscopy

Review of Scientific Instruments

Volumn 68, Issue 8, 1997, Pages 3130-3134

  Harke, M ^a   Teppner, R ^a   Schulz, O ^a   Motschmann, H ^a   Orendi, H ^b  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000045587     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148256     Document Type: Article

References (17)

1. R. M. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North Holland, Amsterdam, 1979).
2. H. Raether, Springer Tracts in Modern Physics, Vol 111: Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer, Berlin, 1988).
3. R. G. Hunsperger. Integrated Optics: Theory and Technology (Springer, Berlin, 1991).
4. P. S, Hauge, Surf. Sci. 96, 108 (1980).
5. F. L. MacCrackin, E. Passaglia, R. R. Stromberg, and H. L. Steinberg, J. Res. Natl. Bur. Stand. Sec. A 67, 108 (1963).
6. D. Beaglehole, Physica B & C 100, 163 (1980).
7. W. Knoll, Materials Science & Technology, Vol. 12, Structures and Properties of Polymers (Chemie, Weinheim, 1993).
8. E. Kretschmann, Opt. Commun. 6, 185 (1972).
9. E. Burstein, W. P. Chen, Y. J. Chen, and A. Hartstein, J. Vac. Sci. Technol. 11, 1004 (1974).
10. D. Honig and D. Möbius, J. Phys. Chem. 95, 4590 (1991).
11. S. Henon and J. Meunier, Rev. Sci. Instrum. 62, 936 (1991).
12. M. Lösche, E. Sackmann, and H. Möhwald, Ber. Bunsenges. Phys. Chem. 10, 848 (1983).
13. R. Reiter, H. Motschmann, H. Orendi, A. Nemetz, and W. Knoll, Langmuir 8, 1784 (1992).
14. E. Aust, W. Hickel, H. Knobloch, H. Orendi, and W. Knoll, Mol. Cryst. Liq. Cryst. 227, 49 (1993).
15. H. Riesenberg, Handbook of Microscopy (VEB Technik, Berlin, 1988).
16. M. Harke, M. Stelzle, and H. Motschmann, Thin Solid Films 284, 412 (1996).
17. C. Lautz, J. Kildae, and Th. Fischer, J. Chem. Phys. 106, 7448 (1997).