메뉴 건너뛰기




Volumn 151, Issue 3, 2004, Pages 95-100

Ellipsometric microscopy: Developments towards biophysics

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; COSTS; ELLIPSOMETRY; IMAGING TECHNIQUES; LIGHTING; NUMERICAL ANALYSIS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SIGNAL PROCESSING; THIN FILMS;

EID: 4544353956     PISSN: 14781581     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-nbt:20040777     Document Type: Conference Paper
Times cited : (2)

References (23)
  • 2
    • 0037741008 scopus 로고    scopus 로고
    • A modified microstamping technique enhances polylysine transfer and neuronal cell patterning
    • Chang, J.C., Brewer, G.J., and Wheeler, B.C.: 'A modified microstamping technique enhances polylysine transfer and neuronal cell patterning', Biomaterials, 2003, 24, pp. 2863-2870
    • (2003) Biomaterials , vol.24 , pp. 2863-2870
    • Chang, J.C.1    Brewer, G.J.2    Wheeler, B.C.3
  • 4
    • 0028849341 scopus 로고
    • Reflection conoscopy and micro-ellipsometry of isotropic thin-film structures
    • Shatalin, S.V., Juskaitis, R., Tan, J.B., and Wilson, T.: 'Reflection conoscopy and micro-ellipsometry of isotropic thin-film structures', J. Microsc., 1995, 179, pp. 241-252
    • (1995) J. Microsc. , vol.179 , pp. 241-252
    • Shatalin, S.V.1    Juskaitis, R.2    Tan, J.B.3    Wilson, T.4
  • 5
    • 0000549859 scopus 로고    scopus 로고
    • Interferometric back focal plane microellipsometry
    • Feke, G.D., Snow, D.P., Grober, R.D., de Groot, P.J., and Deck, L.: 'Interferometric back focal plane microellipsometry', Appl. Opt., 1998, 37, (10), pp. 1796-1802
    • (1998) Appl. Opt. , vol.37 , Issue.10 , pp. 1796-1802
    • Feke, G.D.1    Snow, D.P.2    Grober, R.D.3    De Groot, P.J.4    Deck, L.5
  • 7
    • 0028403156 scopus 로고
    • Image scanning ellipsometry for measuring nonuniform film thickness profiles
    • Liu, A.-H., Wayner, P.C., and Plawsky, J.L.: 'Image scanning ellipsometry for measuring nonuniform film thickness profiles', Appl. Opt., 1994, 33, pp. 1223-1229
    • (1994) Appl. Opt. , vol.33 , pp. 1223-1229
    • Liu, A.-H.1    Wayner, P.C.2    Plawsky, J.L.3
  • 8
    • 36549094974 scopus 로고
    • Spatially resolved ellipsometry
    • Erman, M., and Theeten, J.B.: 'Spatially resolved ellipsometry', J. Appl. Phys., 1986, 69, pp. 859-873
    • (1986) J. Appl. Phys. , vol.69 , pp. 859-873
    • Erman, M.1    Theeten, J.B.2
  • 9
    • 84984363258 scopus 로고
    • Microscopy with an ellipsometric arrangement
    • Löschke, K.: 'Microscopy with an ellipsometric arrangement', Krist. Tech., 1979, 14, pp. 717-720
    • (1979) Krist. Tech. , vol.14 , pp. 717-720
    • Löschke, K.1
  • 10
    • 0018334406 scopus 로고
    • A new ellipsometric method for measurements on surfaces and surface layers
    • Stenberg, M., Sandström, T., and Stiblert, L.: 'A new ellipsometric method for measurements on surfaces and surface layers', Mat. Sci. Eng., 1980, 42, pp. 65-69
    • (1980) Mat. Sci. Eng. , vol.42 , pp. 65-69
    • Stenberg, M.1    Sandström, T.2    Stiblert, L.3
  • 11
    • 36549100146 scopus 로고    scopus 로고
    • Performance of a microscopic imaging ellipsometer
    • Beaglehole, D.: 'Performance of a microscopic imaging ellipsometer', Rev. Sci. Instrum., 1998, 59, pp. 2557-2559
    • (1998) Rev. Sci. Instrum. , vol.59 , pp. 2557-2559
    • Beaglehole, D.1
  • 12
    • 0001275483 scopus 로고    scopus 로고
    • Ellipsomicroscopy for surface imaging - A novel tool to investigate surface dynamics
    • Haas, G., Franz, R.U., Rotermund, H.H., Tromp, R.M., and Ertl, G.: 'Ellipsomicroscopy for surface imaging - a novel tool to investigate surface dynamics', J. Vac. Sci. Technol. A, 1998, 16, pp. 1117-1121
    • (1998) J. Vac. Sci. Technol. A , vol.16 , pp. 1117-1121
    • Haas, G.1    Franz, R.U.2    Rotermund, H.H.3    Tromp, R.M.4    Ertl, G.5
  • 13
    • 84975646109 scopus 로고
    • Dynamic imaging microellipsometry: Theory, system design, and feasibility demonstration
    • Cohn, R.F., Wagner, J.W., and Kruger, J.: 'Dynamic imaging microellipsometry: theory, system design, and feasibility demonstration', Appl. Opt., 1988, 27, pp. 4664-4671
    • (1988) Appl. Opt. , vol.27 , pp. 4664-4671
    • Cohn, R.F.1    Wagner, J.W.2    Kruger, J.3
  • 14
    • 0029389601 scopus 로고
    • 2d imaging ellipsometric microscope
    • Pak, H.K., and Law, B.M.: '2d imaging ellipsometric microscope', Rev. Sci Instrum., 1995, 66, pp. 4972-4976
    • (1995) Rev. Sci Instrum. , vol.66 , pp. 4972-4976
    • Pak, H.K.1    Law, B.M.2
  • 15
    • 0000681116 scopus 로고    scopus 로고
    • Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates
    • Jin, G., Jansson, R., and Arwin, H.: 'Imaging ellipsometry revisited: Developments for visualization of thin transparent layers on silicon substrates', Rev. Sci. Instrum., 1996, 67, pp. 2930-2936
    • (1996) Rev. Sci. Instrum. , vol.67 , pp. 2930-2936
    • Jin, G.1    Jansson, R.2    Arwin, H.3
  • 16
    • 0001712178 scopus 로고    scopus 로고
    • High resolution imaging microellipsometry of soft surfaces at 37 μm lateral and 5 A normal resolution
    • Albersdörfer, A., Elender, G., Mathe, G., Neumaier, K.R., Paduschek, P., and Sackmann, E.: 'High resolution imaging microellipsometry of soft surfaces at 37 μm lateral and 5 A normal resolution', Appl. Phys. Lett., 1998, 72, (23), pp. 2930-2932
    • (1998) Appl. Phys. Lett. , vol.72 , Issue.23 , pp. 2930-2932
    • Albersdörfer, A.1    Elender, G.2    Mathe, G.3    Neumaier, K.R.4    Paduschek, P.5    Sackmann, E.6
  • 17
    • 0026899879 scopus 로고
    • Ellipsometric microscopy: Imaging monomolecular surfactant layers at the air-water interface
    • Reiter, R., Motschmann, H., Orendi, H., Nemetz, A., and Knoll, W.: 'Ellipsometric microscopy: imaging monomolecular surfactant layers at the air-water interface', Langmuir, 1992, 8, pp. 1784-1788
    • (1992) Langmuir , vol.8 , pp. 1784-1788
    • Reiter, R.1    Motschmann, H.2    Orendi, H.3    Nemetz, A.4    Knoll, W.5
  • 18
    • 0000045587 scopus 로고    scopus 로고
    • Description of a single modular optical setup for ellipsometry, surface plasmons, waveguide modes, and their imaging techniques including Brewster angle microscopy
    • Harke, H., Teppner, R., Schulz, O., Orendi, H., and Motschmann, H.: 'Description of a single modular optical setup for ellipsometry, surface plasmons, waveguide modes, and their imaging techniques including Brewster angle microscopy', Rev. Sci. Instrum., 1997, 68, (8), pp. 3130-3134
    • (1997) Rev. Sci. Instrum. , vol.68 , Issue.8 , pp. 3130-3134
    • Harke, H.1    Teppner, R.2    Schulz, O.3    Orendi, H.4    Motschmann, H.5
  • 22
    • 0016059420 scopus 로고
    • Optimizing precision of rotating-analyzer eilipsometers
    • Aspnes, D.E.: 'Optimizing precision of rotating-analyzer eilipsometers', J. Opt. Soc. Am., 1974, 64, (5), pp. 639-646
    • (1974) J. Opt. Soc. Am. , vol.64 , Issue.5 , pp. 639-646
    • Aspnes, D.E.1
  • 23
    • 0001583920 scopus 로고
    • Automated rotating element ellipsometers: Calibration, operation, and realtime applications
    • Collins, R.W: 'Automated rotating element ellipsometers: Calibration, operation, and realtime applications', Rev. Sci. Instrum., 1990, 61, (8), pp. 2029-2062
    • (1990) Rev. Sci. Instrum. , vol.61 , Issue.8 , pp. 2029-2062
    • Collins, R.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.