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Volumn 15, Issue 7, 2005, Pages

Mechanical and electrical characterization of BCB as a bond and seal material for cavities housing (RF-)MEMS devices

Author keywords

[No Author keywords available]

Indexed keywords

BUTENES; CHEMICAL BONDS; COMPUTATIONAL GEOMETRY; MICROWAVES; SHEAR STRENGTH; THERMAL EFFECTS; WAVEGUIDES;

EID: 21044455665     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/15/7/013     Document Type: Article
Times cited : (81)

References (19)
  • 1
    • 0033718159 scopus 로고    scopus 로고
    • The indent reflow sealing (IRS) technique-a method for the fabrication of sealed cavities for MEMS devices
    • Tilmans H A C, Van De Peer M and Beyne E 2000 The indent reflow sealing (IRS) technique-a method for the fabrication of sealed cavities for MEMS devices J. Microelectromech. Syst. 9 206-17
    • (2000) J. Microelectromech. Syst. , vol.9 , Issue.2 , pp. 206-217
    • Tilmans, H.A.C.1    Van De Peer, M.2    Beyne, E.3
  • 3
    • 0042564493 scopus 로고    scopus 로고
    • Micropackaging technologies for integrated microsystems: Applications to MEMS and MOEMS
    • Najafi K 2003 Micropackaging technologies for integrated microsystems: applications to MEMS and MOEMS Proc. SPIE 4978 1-19
    • (2003) Proc. SPIE , vol.4979 , pp. 1-19
    • Najafi, K.1
  • 4
    • 21044457181 scopus 로고    scopus 로고
    • search for BCB or Cyclotene
    • http://www.dow.com (search for BCB or Cyclotene)
  • 5
    • 0007096206 scopus 로고    scopus 로고
    • Low temperature full wafer adhesive bonding of structured wafers
    • Niklaus F, Andersson H, Enoksson P and Stemme G 2000 Low temperature full wafer adhesive bonding of structured wafers Proc. Eurosensors XIV (Copenhagen, Denmark, 27-30 August 2000) pp 431-4
    • (2000) Proc. Eurosensors XIV , pp. 431-434
    • Niklaus, F.1    Andersson, H.2    Enoksson, P.3    Stemme, G.4
  • 7
    • 84945955393 scopus 로고    scopus 로고
    • Wafer-scale 0-level packaging of RF-MEMS devices using BCB
    • Jourdain A, Ziad H, De Moor P and Tilmans H A C 2003 Wafer-scale 0-level packaging of RF-MEMS devices using BCB Proc. DTIP 2003 (Cannes, France, 5-7 May) pp 239-44
    • (2003) Proc. DTIP 2003 , pp. 239-244
    • Jourdain, A.1    Ziad, H.2    De Moor, P.3    Tilmans, H.A.C.4
  • 8
    • 0036120530 scopus 로고    scopus 로고
    • Investigation of the hermeticity of BCB-sealed cavities for housing (RF-)MEMS devices
    • Jourdain A, De Moor P, Pamidighantam S and Tilmans H A C 2002 Investigation of the hermeticity of BCB-sealed cavities for housing (RF-)MEMS devices Proc. MEMS 2002 (Las Vegas, USA, 20-24 Jan.) pp 677-80
    • (2002) Proc. MEMS 2002 , pp. 677-680
    • Jourdain, A.1    De Moor, P.2    Pamidighantam, S.3    Tilmans, H.A.C.4
  • 14
    • 0041431012 scopus 로고    scopus 로고
    • Selective wafer-level adhesive bonding with benzocyclobutene for fabrication of cavities
    • Oberhammer J, Niklaus F and Stemme G 2003 Selective wafer-level adhesive bonding with benzocyclobutene for fabrication of cavities Sensors Actuators A 105 297-304
    • (2003) Sensors Actuators A , vol.105 , Issue.3 , pp. 297-304
    • Oberhammer, J.1    Niklaus, F.2    Stemme, G.3
  • 16
  • 18
  • 19
    • 21044455548 scopus 로고    scopus 로고
    • Hermeticity investigation of sealed 0-level packages based on the damping characteristics of the MEMS device
    • Jourdain A, De Coster J, De Moor P, Puers R and Tilmans H A C 2005 Hermeticity investigation of sealed 0-level packages based on the damping characteristics of the MEMS device Proc. IMPAS-EMPC 2005 (Brugge, Belgium, 13-15 June 2005)
    • (2005) Proc. IMPAS-EMPC 2005
    • Jourdain, A.1    De Coster, J.2    De Moor, P.3    Puers, R.4    Tilmans, H.A.C.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.