Limitations to photon-emission microscopy when applied to "hot" devices

Microelectronics Reliability

Volumn 43, Issue 9-11, 2003, Pages 1645-1650

  Deslandes, Hervé ^a   Lundquist, T R ^a  

^a NPTest   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; NAVIGATION; PHOTONS; RADIATION;

EMISSION MICROSCOPY;

INTEGRATED CIRCUITS;

EID: 0042694385     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(03)00291-9     Document Type: Conference Paper

References (10)

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