Piezoelectric effect in epitaxial PbZr1-x TixO3 thin films near morphotropic phase boundary region

Journal of Materials Research

Volumn 20, Issue 4, 2005, Pages 787-790

  Kim, Yong Kwan ^a   Kim, Sang Sub ^b   Lee, Bongki ^c   Shin, Hyunjung ^c   Baik, Sunggi ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Chonnam National University   (South Korea)

^c Kookmin University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; PEROVSKITE; PIEZOELECTRIC MATERIALS; PIEZOELECTRICITY; POLYCRYSTALLINE MATERIALS; STRESS RELAXATION; THIN FILMS;

MORPHOTROPIC PHASE BOUNDARY; PIEZOELECTRIC HYSTERESIS MEASUREMENTS; PIEZOELECTRIC RESPONSE;

LEAD COMPOUNDS;

EID: 20844463391     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0129     Document Type: Article

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