Thickness effect of ferroelectric domain switching in epitaxial PbTiO 3 thin films on Pt(001)/MgO(001)

Applied Physics Letters

Volumn 84, Issue 25, 2004, Pages 5085-5087

  Kim, Yong Kwan ^a   Kim, Sang Sub ^b   Shin, Hyunjung ^c   Baik, Sunggi ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b Chonnam National University   (South Korea)

^c Kookmin University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; CRYSTAL STRUCTURE; ELASTIC MODULI; ELECTRIC FIELDS; ELECTRIC POTENTIAL; EPITAXIAL GROWTH; LEAD COMPOUNDS; MAGNETRON SPUTTERING; PIEZOELECTRICITY; PULSED LASER DEPOSITION; RESIDUAL STRESSES; STRAIN; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

FERROELASTIC STRAIN; FERROELECTRIC DOMAIN SWITCHING; PIEZOELECTRIC RESPONSES; SCANNING FORCE MICROSCOPY (SFM);

FERROELECTRIC THIN FILMS;

EID: 3142739431     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1759776     Document Type: Article

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