Dual-probe scanning tunneling microscope for study of nanoscale metal-semiconductor interfaces

Review of Scientific Instruments

Volumn 76, Issue 6, 2005, Pages

  Yi, W ^a   Kaya, I I ^b,d   Altfeder, I B ^a   Appelbaum, I ^c   Chen, D M ^b   Narayanamurti, V ^a  

^a HARVARD UNIVERSITY   (United States)

^b HARVARD UNIVERSITY   (United States)

^c UNIVERSITY OF DELAWARE   (United States)

^d SABANCI UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

METAL THIN FILMS; METAL-SEMICONDUCTOR INTERFACES; PLANAR TUNNELING THEORY; SCANNING TUNNELING MICROSCOPE;

COMPUTER SIMULATION; GOLD; INTERFACES (MATERIALS); MONTE CARLO METHODS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; THIN FILMS;

MICROSCOPES;

EID: 20644465391     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1938969     Document Type: Article

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