Hot-electron transport through Au/GaAs and Au/GaAs/AlAs heterojunction interfaces: Ballistic-electron-emission-microscopy measurement and Monte Carlo simulation

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 8, 1996, Pages 4845-4849

  Ke, Mao long ^a   Westwood, D ^a   Matthai, C ^a   Richardson, B ^a   Williams, R ^b  

^a CARDIFF UNIVERSITY   (United Kingdom)

^b SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001026492     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.4845     Document Type: Article

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