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Volumn 71, Issue 4, 2005, Pages

Monte Carlo calculations for metal-semiconductor hot-electron injection via tunnel-junction emission

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRON; ELECTRON MICROSCOPY; FLAME PHOTOMETRY; MONTE CARLO METHOD; SEMICONDUCTOR;

EID: 15744400075     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.045320     Document Type: Article
Times cited : (15)

References (23)
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.