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Volumn 71, Issue 4, 2005, Pages
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Monte Carlo calculations for metal-semiconductor hot-electron injection via tunnel-junction emission
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
ELECTRON;
ELECTRON MICROSCOPY;
FLAME PHOTOMETRY;
MONTE CARLO METHOD;
SEMICONDUCTOR;
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EID: 15744400075
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.71.045320 Document Type: Article |
Times cited : (15)
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References (23)
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