Ballistic-electron-emission microscopy: A nanometer-scale probe of interfaces and carrier transport

Annual Review of Materials Science

Volumn 26, Issue 1, 1996, Pages 189-222

  Bell, L Douglas ^a   Kaiser, William J ^a,b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b University of California   (United States)

Author keywords

Band structure; Hot electron transport; Scanning tunneling microscopy; Semiconductor heterostructures; Semiconductor interfaces

Indexed keywords

BALLISTICS; CHARGE CARRIERS; ELECTRON SPECTROSCOPY; FERMI LEVEL; HOT CARRIERS; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; SURFACE PROPERTIES;

ATOMIC SCALE PROBE; BALLISTIC ELECTRON EMISSION MICROSCOPY; CARRIER TRANSPORT; NANOMETER SCALE SPATIAL RESOLUTION; SCHOTTKY BARRIER HEIGHT;

ELECTRON MICROSCOPY;

EID: 2342498748     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.ms.26.080196.001201     Document Type: Article

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