High sensitivity, high resolution X-ray photoelectron analysis of InN

Physica Status Solidi C: Conferences

Volumn , Issue 7, 2003, Pages 2785-2789

  Wintrebert Fouquet, Marie ^a   Butcher, K Scott A ^a   Motlan, ^b  

^a MACQUARIE UNIVERSITY   (Australia)

^b UNIVERSITAS NEGERI MEDAN   (Indonesia)

Author keywords

[No Author keywords available]

Indexed keywords

BULK PROPERTIES; DEGENERATE MATERIALS; ENERGY RESOLUTIONS; HIGH RESOLUTION; HIGH SENSITIVITY; OPTICAL ABSORPTION MEASUREMENT; SAMPLE SURFACE; X-RAY PHOTOELECTRONS;

ELECTRON SPECTROSCOPY; NITRIDES; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACES;

EID: 20644435419     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200303438     Document Type: Conference Paper

References (22)

1. C. P. Foley and J. Lyngdal, J. Vac. Sci. Technol. A 5, 1708 (1987).
2. S. Kumarl, Li Mo, Motlan, and T. L. Tansley, Jpn. J. Appl. Phys. 35, 2267 (1996).
3. Motlan. E. M. Goldys, and T. L Tansley, J. Cryst. Growth 241, 165 (2002).
4. M. Wintrebert-Fouquet and K. S. A. Butcher, J. Vac. Sci. Technol A, 20, 2131 (2002).
5. A. Kasic, M. Schubert, Y. Saito, Y. Nanishi, and G. Wagner, Phys. Rev. B 65, 115206 (2002).
6. B. E. Fortz, S. K. O'Leary, M. S. Shur, and L. F. Eastman, J. Appl. Phys. 85, 7727 (1999).
7. Y. Saito, H. Harima, E. Kurimoto, T. Yamaguchi, N. Teraguchi, A. Suziki, T. Araki, and Y. Nanishi, phys. stat. sol. (b) 234, 786 (2002).
8. T. Inushima, V. V. Mamuin, V. A. Verksin, S. V. Ivanov, T. Sakon, and S. Motokawa, J. Cryst. Growth 227, 481 (2001).
9. V. Y. Davidov, A. A. Klochikhin, R. P. Seishan, V. V. Emtsev, S. V. Ivanov, F. Bechstedt, J. Furthmüller, H. Harima, and A. V. Mudryi, phys. stat. sol. (b) 229, R1 (2002).
10. T. L. Tansley and C. P. Foley, J. Appl. Phys. 59, 3241 (1986).
11. T. Yodo, H. Yona, H. Ando, D. Nosei, and Y. Harada, Appl. Phys. Lett. 80, 968 (2002).
12. B. K. Ridley, Quantum Processes in Semiconductors 2nd ed. (Clarendon Press, Oxford, 1988), p. 211.
13. K. S. A. Butcher, H. Timmers, M. Wintrebert-Fouquet, P. P.-T. Chen, S. K. Shrestha, and R. G. Elliman, submitted to ISPN 2003 Materials Science in Semiconductor Processing (2003).
14. H. Lu, W. J. Schaff, and L. F. Eastman, submitted to Mater. Res. Soc. 2002 Falls meeting in Boston, Dec. (2002).
15. T. L. Tansley and C. P. Foley, Electron. Lett. 20, 1066 (1984).
16. K. S. A. Butcher, M. Wintrebert-Fouquet, Motlan, S. K. Shrestha, H. Timmers, K. E. Prince, and T. L. Tansley, accepted at Mater. Res. Soc. 2002, Falls meeting in Boston, Dec. (2002).
17. K. S. A. Butcher, M. Wintrebert-Fouquet, P. P.-T Chen, T. L. Tansley, and Surapon Srikeaw, Mater. Res. Soc. Symp. Proc. 693, I6. 9. 1. (2001).
18. M. Wintrebert-Fouquet, K. S. A. Butcher, and Motlan, submitted to 2002 COMAD: Conference on Optoelectronic Materials and Devices Proceedings (2002).
19. M. Wintrebert-Fouquet, K. S. A. Butcher, and S. K. L. Lam, accepted at Mater. Res. Soc. 2002 Falls meeting in Boston, Dec. (2002).
20. J. F. Moulder, W. F. Stickle, P. E. Sobol, and K. D. Bomden, Handbook of X-ray Photoelectron Spectroscopy, edited by J. Chastain (Perkin-Elemer Corporation, Physical Electronics Division, Eden Prairie, 1992).
21. http://srdata.nist.gov/xps
22. K. S. A. Butcher, T. L. Tansley, and Xin Li, Surf. Interface Anal. 25, 99 (1997).