Determination of optical birefringence by using off-axis transmission ellipsometry

Applied Optics

Volumn 44, Issue 16, 2005, Pages 3153-3159

  Jellison Jr , Gerald E ^a   Rouleau, Christopher M ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; CRYSTALLINE MATERIALS; ELECTROMAGNETIC DISPERSION; ELLIPSOMETRY; MATRIX ALGEBRA; OPTICAL MATERIALS; REFRACTIVE INDEX; X RAY ANALYSIS;

DEPOLARIZATION; PHOTOELASTIC MODULATORS (PEM); SPECTROSCOPIC BIREFRINGENCES; TRANSMISSION ELLIPSOMETRY;

BIREFRINGENCE;

EID: 20544468760     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.003153     Document Type: Article

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