Characterization of linear diattenuator and retarders using a two-modulator generalized ellipsometer (2-MGE)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4819, Issue , 2002, Pages 9-19

  Jellison Jr , G E ^a   Griffiths, C O ^b   Holcomb, D E ^a   Rouleau, C M ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Hinds Instruments Incorporated   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; ELLIPSOMETRY; INFRARED RADIATION; LIGHT POLARIZATION; MODULATORS;

POLAROID FILM POLARIZERS;

OPTICAL INSTRUMENTS;

EID: 18744400789     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.450409     Document Type: Conference Paper

References (15)

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