Piezoresistive detection-based ferromagnetic resonance force microscopy of microfabricated exchange bias systems

Applied Physics Letters

Volumn 85, Issue 24, 2004, Pages 5935-5937

  Volodin, A ^a   Buntinx, D ^a   Brems, S ^a   Van Haesendonck, C ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COBALT COMPOUNDS; EPITAXIAL GROWTH; FERROMAGNETIC MATERIALS; HIGH RESOLUTION ELECTRON MICROSCOPY; LIGHT EMITTING DIODES; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS;

FERROMAGNETIC RESONANCE FORCE MICROSCOPY; MICROFABRICATED EXCHANGE BIAS SYSTEM; PHOTOGALVANIC EFFECTS; PIEZORESISTIVE DETECTION;

FERROMAGNETIC RESONANCE;

EID: 20444438797     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1836866     Document Type: Article

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