Ferromagnetic resonance detection with a torsion-mode atomic-force microscope

Applied Physics Letters

Volumn 76, Issue 9, 2000, Pages 1176-1178

  Löhndorf, Markus ^a   Moreland, John ^a   Kabos, Pavel ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037662594     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125989     Document Type: Article

References (12)

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9. In this experiment, a micromechanical calorimetric sensor is used to detect FMR of thin magnetic films. The calorimetric sensor is a silicon AFM cantilever coated with a thin magnetic film onto one side. The cantilever bends at resonance, due to thermal absorption of the microwave power.
10. T. G. Ruskell, M. Löhndorf, and J. Moreland, J. Appl. Phys. 1, 664 (1998).
11. P. Kabos, in High Frequency Processes in Magnetic Materials, edited by G. Srinivasan and A. Slavin (World Scientific, Singapore, 1995).
12. J. M. Nash, P. Kabos, R. Staudinger, and C. E. Patton, J. Appl. Phys. 5, 2689 (1998).