Exchange bias relaxation in CoO-biased films

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6406-6408

  McMichael, R D ^b   Lee, C G ^a,b   Stiles, M D ^b   Serpa, F G ^b   Chen, P J ^b   Egelhoff Jr , W F ^b  

^a Changwon National University   (South Korea)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000993531     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373424     Document Type: Article

References (14)

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