Tomographic x-ray absorption spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5535, Issue , 2004, Pages 715-723

  Schroer, C G ^a,b   Kuhlmann, M ^a   Gunzler T F ^a   Lengeler, B ^a   Richwin, M ^c   Griesebock, B ^c   Lutzenkirchen Hecht D ^c   Frahm, R ^c   Ziegler, E ^d   Mashayekhi, A ^e   Haeffner, D R ^e   Grunwaldt, J D ^f   Baiker, A ^f  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b DESY   (Germany)

^c UNIVERSITY OF WUPPERTAL   (Germany)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^e ARGONNE NATIONAL LABORATORY   (United States)

^f ETH ZURICH   (Switzerland)

Author keywords

QEXAFS monochromator; Refractive x ray lenses; Scanning x ray microscopy; Tomography; X ray absorption spectroscopy

Indexed keywords

ABSORPTION; CATALYSTS; DATA ACQUISITION; LENSES; MONOCHROMATORS; TOMOGRAPHY; X RAY ANALYSIS; X RAY MICROSCOPES;

QEXAFS MONOCHROMATORS; REFRACTIVE X-RAY LENSES; SCANNING MICROTOMOGRAPHY; SCANNING X-RAY MICROSCOPY; X-RAY ABSORPTION SPECTROSCOPY;

X RAY SPECTROSCOPY;

EID: 20144363455     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.559706     Document Type: Conference Paper

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