-
1
-
-
0027112247
-
Resolution enhancement by deconvolution using field emission source in electron energy loss spectroscopy
-
P.E. Batson, D.W. Johnson, and J.C.H. Spence Resolution enhancement by deconvolution using field emission source in electron energy loss spectroscopy Ultramicroscopy 41 1992 137 145
-
(1992)
Ultramicroscopy
, vol.41
, pp. 137-145
-
-
Batson, P.E.1
Johnson, D.W.2
Spence, J.C.H.3
-
2
-
-
0037626657
-
A sub-50 meV spectrometer and energy filter for use in combination with 200 kV monochromated (S)TEMs
-
H.A. Brink, M.M.G. Barfels, R.P. Burgner, and B.N. Edwards A sub-50 meV spectrometer and energy filter for use in combination with 200 kV monochromated (S)TEMs Ultramicroscopy 96 2003 367 384
-
(2003)
Ultramicroscopy
, vol.96
, pp. 367-384
-
-
Brink, H.A.1
Barfels, M.M.G.2
Burgner, R.P.3
Edwards, B.N.4
-
4
-
-
0032656064
-
Field emission energy distribution from individual multiwalled carbon nanotubes
-
M.J. Fransen, T.L.v. Rooy, and P. Kruit Field emission energy distribution from individual multiwalled carbon nanotubes Appl. Surf. Sci. 146 1999 312 327
-
(1999)
Appl. Surf. Sci.
, vol.146
, pp. 312-327
-
-
Fransen, M.J.1
Rooy, T.L.V.2
Kruit, P.3
-
5
-
-
33750852489
-
Characterization and compensation of environmental magnetic fields for a monochromized TEM
-
D.V. Dyck P.V. Oostweldt University of Antwerp Belgium
-
W. Grogger, G. Kothleitner, B. Kraus, and F. Hofer Characterization and compensation of environmental magnetic fields for a monochromized TEM D.V. Dyck P.V. Oostweldt 13th European Microscopy Congress (EMC 2004) 2004 2004 University of Antwerp Belgium 271 272
-
(2004)
13th European Microscopy Congress (EMC 2004)
, vol.2004
, pp. 271-272
-
-
Grogger, W.1
Kothleitner, G.2
Kraus, B.3
Hofer, F.4
-
6
-
-
20144376704
-
-
HREM Research Inc.
-
Ishizuka, K., 2003. DeConvEELS, HREM Research Inc., http://www. hremresearch.com.
-
(2003)
DeConvEELS
-
-
Ishizuka, K.1
-
7
-
-
0027669999
-
Analysis of electron image detection efficiency of slow-scan CCD cameras
-
K. Ishizuka Analysis of electron image detection efficiency of slow-scan CCD cameras Ultramicroscopy 52 1993 7 20
-
(1993)
Ultramicroscopy
, vol.52
, pp. 7-20
-
-
Ishizuka, K.1
-
8
-
-
0037917004
-
Software techniques for EELS to realize about 0.3 eV energy resolution using 300 kV FEG-TEM
-
K. Kimoto, and Y. Matsui Software techniques for EELS to realize about 0.3 eV energy resolution using 300 kV FEG-TEM J. Microsc. 208 2002 224 228
-
(2002)
J. Microsc.
, vol.208
, pp. 224-228
-
-
Kimoto, K.1
Matsui, Y.2
-
10
-
-
11144275731
-
Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy
-
K. Kimoto, G. Kothleitner, W. Grogger, Y. Matsui, and F. Hofer Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy Micron 36 2005 185 189
-
(2005)
Micron
, vol.36
, pp. 185-189
-
-
Kimoto, K.1
Kothleitner, G.2
Grogger, W.3
Matsui, Y.4
Hofer, F.5
-
11
-
-
0141906784
-
EELS performance measurements on a new high energy resolution imaging filter
-
G. Kothleitner, and F. Hofer EELS performance measurements on a new high energy resolution imaging filter Micron 34 2003 211 218
-
(2003)
Micron
, vol.34
, pp. 211-218
-
-
Kothleitner, G.1
Hofer, F.2
-
12
-
-
0038502004
-
Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy
-
S. Lazar, G.A. Botton, M.-Y. Wu, F.D. Tichelaar, and H.W. Zandbergen Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy Ultramicroscopy 96 2003 535 546
-
(2003)
Ultramicroscopy
, vol.96
, pp. 535-546
-
-
Lazar, S.1
Botton, G.A.2
Wu, M.-Y.3
Tichelaar, F.D.4
Zandbergen, H.W.5
-
13
-
-
0038502019
-
Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution
-
C. Mitterbauer, G. Kothleitner, W. Grogger, H. Zandbergen, B. Freitag, P. Tiemeijer, and F. Hofer Electron energy-loss near-edge structures of 3d transition metal oxides recorded at high-energy resolution Ultramicroscopy 96 2003 469 480
-
(2003)
Ultramicroscopy
, vol.96
, pp. 469-480
-
-
Mitterbauer, C.1
Kothleitner, G.2
Grogger, W.3
Zandbergen, H.4
Freitag, B.5
Tiemeijer, P.6
Hofer, F.7
-
14
-
-
1542328994
-
Measuring the absolute position of EELS ionisation edges in a TEM
-
P.L. Potapov, and D. Schryvers Measuring the absolute position of EELS ionisation edges in a TEM Ultramicroscopy 99 2004 73 85
-
(2004)
Ultramicroscopy
, vol.99
, pp. 73-85
-
-
Potapov, P.L.1
Schryvers, D.2
-
15
-
-
18644366383
-
Development of an 0.2 eV energy resolution analytical electron microscope
-
M. Tanaka, M. Terauchi, K. Tsuda, K. Saitoh, M. Mukai, T. Kaneyama, T. Tomita, K. Tsuno, M. Kersker, M. Naruse, and T. Honda Development of an 0.2 eV energy resolution analytical electron microscope Microsc. Microanal. 8 Suppl. 2 2002 68 69
-
(2002)
Microsc. Microanal.
, vol.8
, Issue.2 SUPPL.
, pp. 68-69
-
-
Tanaka, M.1
Terauchi, M.2
Tsuda, K.3
Saitoh, K.4
Mukai, M.5
Kaneyama, T.6
Tomita, T.7
Tsuno, K.8
Kersker, M.9
Naruse, M.10
Honda, T.11
-
16
-
-
0033007840
-
Measurement of Coulomb interactions in an electron beam monochromator
-
P.C. Tiemeijer Measurement of Coulomb interactions in an electron beam monochromator Ultramicroscopy 78 1999 53 62
-
(1999)
Ultramicroscopy
, vol.78
, pp. 53-62
-
-
Tiemeijer, P.C.1
-
17
-
-
0036409165
-
Monochromized 200 kV (S)TEM
-
P.C. Tiemeijer, J.H.A.v. Lin, B.H. Freitag, and A.F.d. Jong Monochromized 200 kV (S)TEM Microsc. Microanal. 8 Suppl. 2 2002 70 71
-
(2002)
Microsc. Microanal.
, vol.8
, Issue.2 SUPPL.
, pp. 70-71
-
-
Tiemeijer, P.C.1
Lin, J.H.A.V.2
Freitag, B.H.3
Jong, A.F.D.4
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