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Volumn 96, Issue 5, 2005, Pages 496-502
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Analytical TEM study of microstructure -property relations in liquid-phase-sintered SiC with AIN- Y2O3 additives
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Author keywords
Analytical electron microscopy; Grain boundary; Intergranular phase; Liquid phase sintering; Silicon carbide; Solid solution
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Indexed keywords
ADDITIVES;
ALUMINUM NITRIDE;
CRYSTAL STRUCTURE;
GRAIN BOUNDARIES;
INTERFACES (MATERIALS);
MICROSTRUCTURE;
PHASE TRANSITIONS;
PRECIPITATION (CHEMICAL);
SINTERING;
SOLID SOLUTIONS;
TRANSMISSION ELECTRON MICROSCOPY;
YTTRIUM COMPOUNDS;
ANALYTICAL ELECTRON MICROSCOPY;
INTERGRANULAR PHASE;
LIQUID-PHASE SINTERING;
TWO-PHASE INTERFACES;
SILICON CARBIDE;
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EID: 20144373311
PISSN: 00443093
EISSN: None
Source Type: Journal
DOI: 10.3139/146.018133 Document Type: Conference Paper |
Times cited : (7)
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References (41)
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