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Volumn 96, Issue 5, 2005, Pages 496-502

Analytical TEM study of microstructure -property relations in liquid-phase-sintered SiC with AIN- Y2O3 additives

Author keywords

Analytical electron microscopy; Grain boundary; Intergranular phase; Liquid phase sintering; Silicon carbide; Solid solution

Indexed keywords

ADDITIVES; ALUMINUM NITRIDE; CRYSTAL STRUCTURE; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MICROSTRUCTURE; PHASE TRANSITIONS; PRECIPITATION (CHEMICAL); SINTERING; SOLID SOLUTIONS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

EID: 20144373311     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.018133     Document Type: Conference Paper
Times cited : (7)

References (41)
  • 20
    • 85039397308 scopus 로고
    • Doctoral Thesis, University of Stuttgart
    • M. Nader: Doctoral Thesis, University of Stuttgart, 1995.
    • (1995)
    • Nader, M.1
  • 22
    • 85039388829 scopus 로고    scopus 로고
    • Doctoral Thesis, University of Stuttgart
    • I. Wiedmann: Doctoral Thesis, University of Stuttgart, 1998.
    • (1998)
    • Wiedmann, I.1
  • 27
    • 85039410658 scopus 로고    scopus 로고
    • Doctoral Thesis, University of Stuttgart
    • H.H. Ye: Doctoral Thesis, University of Stuttgart, 2002.
    • (2002)
    • Ye, H.H.1
  • 39
    • 85039406671 scopus 로고
    • Diploma Thesis, University of Stuttgart
    • A. Jeutter: Diploma Thesis, University of Stuttgart, 1993.
    • (1993)
    • Jeutter, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.