Comparison of sgregation behaviors for special and general boundaries in polycrystalline Al2O3 with SiO2-TiO2 impurities

Interface Science

Volumn 12, Issue 2-3, 2004, Pages 335-342

  Chi, Miaofang ^a   Gu, Hui ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Alumina; General boundary; Segregation; Twin boundary

Indexed keywords

FILM GROWTH; GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMPURITIES; POLYCRYSTALS; SEGREGATION (METALLOGRAPHY); SILICA; TITANIUM OXIDES;

BOUNDARY STRUCTURES; GENERAL BOUNDARY; TWIN BOUNDARY;

ALUMINA;

EID: 3543049058     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:INTS.0000028663.24520.bc     Document Type: Conference Paper

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