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A microscope for hard x-rays based on parabolic compound refractive lenses
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B. Lengeler, C. G. Schroer, M. Richwin, J. Tümmler, M. Drakopoulos, A. Snigirev, and I. Snigireva, "A microscope for hard x-rays based on parabolic compound refractive lenses," Appl. Phys. Lett. 74(26), pp. 3924-3926, 1999.
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C. G. Schroer, M. Kuhlmann, B. Lengeler, T. F. Günzler, O. Kurapova, B. Benner, C. Rau, A. S. Simionovici, A. Snigirev, and I. Snigireva, "Beryllium parabolic refractive x-ray lenses," in Design and Microfabrication of Novel X-Ray Optics, D. C. Mancini, ed., Proceedings of the SPIE 4783, pp. 10-18, SPIE, (Bellingham), 2002.
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X-Ray Micro- and Nano-Focusing: Applications and Techniques II, I. McNulty, ed.
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C. G. Schroer, J. Tümmler, B. Lengeler, M. Drakopoulos, A. Snigirev, and I. Snigireva, "Compound refractive lenses: High quality imaging optics for the XFEL," in X-Ray FEL Optics and Instrumentation, D. M. Mills, H. Schulte-Schrepping, and J. R. Arthur, eds., Proceedings of the SPIE 4143, pp. 60-68, 2001.
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Fourth Generation X-Ray Sources and Optics II, S. G. Biedron, W. Eberhardt, T. Ishikawa, and R. O. Tatchyn, eds., To be published
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C. G. Schroer, B. Benner, M. Kuhlmann, O. Kurapova, B. Lengeler, F. Zontone, A. Snigirev, I. Snigireva, and H. Schulte-Schrepping, "Focusing hard x-ray fel beams with parabolic refractive lenses," in Fourth Generation X-Ray Sources and Optics II, S. G. Biedron, W. Eberhardt, T. Ishikawa, and R. O. Tatchyn, eds., Proceedings of the SPIE 5534, 2004. To be published.
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C. G. Schroer, B. Benner, T. F. Günzler, M. Kuhlmann, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev, and I. Snigireva, "Magnified hard X-ray microtomography: Toward tomography with sub-micron resolution," in Developments in X-Ray Tomography III, U. Bonse, ed., Proceedings of the SPIE 4503, pp. 23-33, 2002.
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C. G. Schroer, M. Kuhlmann, U. T. Hunger, T. F. Günzler, O. Kurapova, S. Feste, F. Frehse, B. Lengeler, M. Drakopoulos, A. Somogyi, A. S. Simionovici, A. Snigirev, I. Snigireva, C. Schug, and W. H. Schröder, "Nanofocusing parabolic refractive x-ray lenses," Appl. Phys. Lett. 82(9), pp. 1485-1487, 2003.
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Design and Microfabrication of Novel X-Ray Optics II, A. S. Snigirev and D. C. Mancini, eds., To be published
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C. G. Schroer, J. Meyer, M. Kuhlmann, B. Benner, T. F. Günzler, B. Lengeler, C. Rau, T. Weitkamp, A. Snigirev, and I. Snigireva, "Nanotomography based on hard x-ray microscopy with refractive lenses," Appl. Phys. Lett. 81(8), pp. 1527-1529, 2002.
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Dislocation density analysis in single grains of steel by X-ray scanning microdiffraction
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O. Castelnau, M. Drakopoulos, C. G. Schroer, I. Snigireva, A. Snigirev, and T. Ungar, "Dislocation density analysis in single grains of steel by X-ray scanning microdiffraction," Nucl. Instrum. Methods A 467-468, pp. 1245-1248, 2001.
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S. Bohic, A. Simionovici, A. Snigirev, R. Ortega, G. Devès, D. Heymann, and C. G. Schroer, "Synchrotron hard x-ray microprobe: Fluorescence imaging of single cells," Appl. Phys. Lett. 78, pp. 3544-3546, 2001.
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High-resolution x-ray fluorescence microtomography of homogeneous samples
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A. S. Simionovici, M. Chukalina, C. Schroer, M. Drakopoulos, A. Snigirev, I. Snigireva, B. Lengeler, K. Janssens, and F. Adams, "High-resolution x-ray fluorescence microtomography of homogeneous samples," IEEE Trans. Nucl. Sci. 47(6), pp. 2736-2740, 2000.
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Penetrating Radiation Systems and Applications II, F. P. Doty, H. B. Barber, H. Roehrig, and E. J. Morton, eds.
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C. G. Schroer, J. Tümmler, T. F. Günzler, B. Lengeler, W. H. Schröder, A. J. Kuhn, A. S. Simionovici, A. Snigirev, and I. Snigireva, "Fluorescence microtomography: External mapping of elements inside biological samples," in Penetrating Radiation Systems and Applications II, F. P. Doty, H. B. Barber, H. Roehrig, and E. J. Morton, eds., Proceedings of the SPIE 4142, pp. 287-296, 2000.
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C. G. Schroer, M. Kuhlmann, T. F. Günzler, B. Lengeler, M. Richwin, B. Griesebock, D. Lützenkirchen-Hecht, R. Frahm, E. Ziegler, A. Mashayekhi, D. Haeffner, J.-D. Grunwaldt, and A. Baiker, "Mapping the chemical states of an element inside a sample using tomographic x-ray absorption spectroscopy," Appl. Phys. Lett. 82(19), pp. 3360-3362, 2003.
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