Simulated scanning tunneling microscopy images of three-dimensional clusters: H8Si8O12 on Si(100)-2×1

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 8, 2004, Pages

  Chen, Yunqing ^a   Schneider, Kevin S ^a   Banaszak Holl, Mark M ^a   Orr, B G ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; OXIDE; SILICON;

ARTICLE; CALCULATION; DENSITY; DENSITY FUNCTIONAL THEORY; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGE RECONSTRUCTION; MODEL; SCANNING TUNNELING MICROSCOPY; SIMULATION;

EID: 19544370011     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.085402     Document Type: Article

References (32)

1. P. S. Weiss and D. M. Eigler, Phys. Rev. Lett. 71, 3139 (1993).
2. J. Bardeen, Phys. Rev. Lett. 6, 57 (1961).
3. J. Tersoff and D. R. Hamann, Phys. Rev. B 31, 805 (1985).
4. C. J. Chen, Phys. Rev. B 42, 8841 (1990).
5. W. A. Hofer and J. Redinger, Surf. Sci. 447, 51 (2000).
6. W. A. Hofer, A. J. Fisher, and R. A. Wolkow, Surf. Sci. 475, 83 (2001).
7. P. Sautet, Chem. Rev. 97, 1097 (1997).
8. J. Crystal, L. Y. Zhang, R. A. Friesner, and G. W. Flynn, J. Phys. Chem. A 106, 1802 (2002).
9. M. M. Banaszak Holl and F. R. McFeely, Phys. Rev. Lett. 71, 2441 (1993).
10. S. Lee, S. Makan, M. M. Banaszak Holl, and F. R. McFeely, J. Am. Chem. Soc. 116, 11819 (1994).
11. J. N. Greeley, L. M. Meeuwenberg, and M. M. Banaszak Holl, J. Am. Chem. Soc. 120, 7776 (1998).
12. K. S. Schneider, Z. Zhang, M. M. Banaszak Holl, B. G. Orr, and U. C. Pernisz, Phys. Rev. Lett. 85, 602 (2000).
13. K. Raghavachari and J. Eng, Phys. Rev. Lett. 84, 935 (2000).
14. K. Raghavachari, A. Pasquarello, J. Eng, and M. S. Hybertsen, Appl. Phys. Lett. 76, 3873 (2000).
15. H. N. Waltenburg and J. T. Yates, Chem. Rev. 95, 1589 (1995).
16. R. J. Hamers and Y. J. Wang, Chem. Rev. 96, 1261 (1996).
17. P. A. Agaskar, Inorg. Chem. 30, 2707 (1991).
18. P. A. Agaskar and W. G. Klemperer, Inorg. Chim. Acta 229, 355 (1995).
19. R. H. Baney, M. Itoh, A. Sakakibara, and T. Suzuki, Chem. Rev. 95, 1409 (1995).
20. K. T. Nicholson and M. M. Banaszak Holl, Phys. Rev. B 64, 155317 (2001).
21. J. Shoemaker, L. W. Burggraf, and M. S. Gordon, J. Chem. Phys. 112, 2994 (2000).
22. T. D. Crawford, J. F. Stanton, J. C. Saeh, and H. F. Schaefer, J. Am. Chem. Soc. 121, 1902 (1999).
23. R. A. King, T. D. Crawford, J. F. Stanton, and H. F. Schaefer, J. Am. Chem. Soc. 121, 10788 (1999).
24. M. M. Banaszak Holl, S. H. Lee, and F. R. McFeely, Appl. Phys. Lett. 65, 1097 (1994).
25. F. R. McFeely, K. Z. Zhang, M. M. Banaszak Holl, S. H. Lee, and J. E. Bender, J. Vac. Sci. Technol. B 14, 2824 (1996).
26. W. C. Simpson, J. A. Yarmoff, W. H. Hung, and F. R. McFeely, Surf. Sci. 355, L283 (1996).
27. Jaguar 4.0; Schrödinger, 1500 S.W. First Ave., Suite 1180, Portland, OR 97201.
28. G. Orlandi, A. Troisi, and F. Zerbetto, J. Am. Chem. Soc. 121, 5392 (1999).
29. M. Tsukada, K. Kobayashi, and N. Isshiki, Surf. Sci. 242, 12 (1991).
30. J. Dabrowski and M. Scheffler, Appl. Surf. Sci. 56, 15 (1992).
31. R. J. Hamers, R. M. Tromp, and J. E. Demuth, Phys. Rev. B 34, 5343 (1986).
32. K. H. Xiang, R. Pandey, U. C. Pernisz, and C. Freeman, J. Phys. Chem. B 102, 8704 (1998).