Surface infrared studies of silicon/silicon oxide interfaces derived from hydridosilsesquioxane clusters

Journal of the American Chemical Society

Volumn 120, Issue 31, 1998, Pages 7776-7782

  Greeley, J N ^a   Meeuwenberg, L M ^a   Holl, M M Banaszak ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ADSORPTION; ARTICLE; ELECTRONICS; INFRARED SPECTROSCOPY; MODEL; STOICHIOMETRY; STRUCTURE ANALYSIS; WATER CONTAMINATION;

EID: 0032511387     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja980741o     Document Type: Article

References (23)

1. 2 Interface-3; Massoud, H. Z., Poindexter, E. H., Helms, C. R., Eds.; The Electrochemical Society, Inc.: Pennington, NJ, 1996; and references therein.
2. (a) Banaszak Holl, M. M.; McFeely, F. R. Phys. Rev. Lett. 1993, 71, 2441.
3. (b) Lee, S.; Makan, S.; Banaszak Holl, M. M.; McFeely, F. R. J. Am. Chem. Soc. 1994, 116, 11819.
4. (c) Zhang, K. Z.; Meeuwenberg, L. M.; Banaszak Holl, M. M.; McFeely, F. R. Jpn. J. Appl. Phys. 1997, 36, 1622.
5. (d) Zhang, K. Z.; Banaszak Holl, M. M.; Bender, J. B.; Lee, S.; McFeely, F. R. Phys. Rev. B 1996, 54, 7686.
6. Ehrley, W.; Butz, R.; Mantl, S. Surf. Sci. 1991, 248, 193.
7. Agaskar, P. A. Inorg. Chem. 1991, 30, 2708.
8. Bürgy, H.; Calzaferri, G. Helv. Chim. Acta 1990, 73, 968.
9. Greeley, J. N.; Lee, S.; Banaszak Holl, M. M. J. Appl. Organomet. Chem. In press.
10. Greeley, J. N.; Banaszak Holl, M. M. Appl. Phys. Lett. Manuscript in preparation.
11. Marcolli, C.; Calzaferri, G. J. Appl. Organomet. Chem. and references therein. In press.
12. (a) Ibach, H.; Wagner, H.; Bruchmann, D. Solid State Commun. 1982, 42, 457.
13. (b) Chabal, Y. J.; Christman, S. B. Phys. Rev. B 1984, 29, 6974.
14. Chabal, Y. J. Surf. Sci. Rep. 1988, 8, 211.
15. For additional lead references on MIR and ATR experiments on surfaces containing Si-H see: Hattori, T. Crit. Rev. Solid State Mater. Sci. 1995, 20, 339.
16. Eng, J., Jr.; Raghavachari, K.; Struck, L. M.; Chabal, Y. J.; Bent, B. E.; Flynn, G. W.; Christman, S. B.; Chaban, E. E.; Williams, G. P.; Radermacher, K.; Mantl, S. J. Chem. Phys. 1997, 106, 9889.
17. Private communication with Udo Pernisz, Division of Electronic Materials, Dow Corning.
18. Lukevits, E.; Simchenko, L. I.; Dzintara, M. Zh. Obshch. Khim. 1974, 44, 1489.
19. Brown, J. F.; Vogt, J. H.; Prescott, P. I. J. Am. Chem. Soc. 1964, 86, 1120.
20. Lander, J. J.; Morrison, J. J. Chem. Phys. 1962, 37, 729.
21. Ignatiev, A.; Jona, F.; Debe, M.; Johnoson, D. E.; White, S. J.; Woodruff, D. P. J. Phys. C 1977, 10, 1109.
22. White, S. J.; Woodruff, D. P.; Holland, B. W.; Zimmer, R. S. Surf. Sci. 1978, 74, 34.
23. Carley, A. F.; Rajumon, M. K.; Roberts, M. W.; Wells, P. B. Chem. Soc. Faraday Trans. 1995, 91, 2167.