Infrared and density-functional-theory study of spherosiloxane-based model silicon/silicon oxide interfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 64, Issue 15, 2001, Pages

  Nicholson, Kenneth T ^a   Banaszak Holl, Mark M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OXIDE; SILICON; SILICON DERIVATIVE; SILOXANE;

ABSORPTION SPECTROSCOPY; ARTICLE; CALCULATION; DENSITY; INFRARED SPECTROSCOPY; REFLECTOMETRY; THEORY;

EID: 0035887403     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.64.155317     Document Type: Article

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