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Volumn 121, Issue 23, 1999, Pages 5392-5395

Simulation of STM images from commercially available software

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ARTICLE; COMPUTER PROGRAM; COMPUTER SIMULATION; ELECTRON TRANSPORT; ENANTIOMER; IMAGE ANALYSIS; QUANTUM MECHANICS; RELIABILITY; SCANNING TUNNELING MICROSCOPY;

EID: 0033575125     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja983643b     Document Type: Article
Times cited : (20)

References (20)
  • 1
    • 0003425118 scopus 로고
    • Springer Series in Surfactant Science, Springer-Verlag: Berlin
    • Gunterodt, H. J., Wiensendander R., Ed., Scanning Tunnelling Microscopy; Springer Series in Surfactant Science, Springer-Verlag: Berlin 1994; Bonnell, D. A., Ed. Scanning Tunnelling Microscopy and Spectroscopy VCH: New York, 1993.
    • (1994) Scanning Tunnelling Microscopy
    • Gunterodt, H.J.1    Wiensendander, R.2
  • 2
    • 0003832847 scopus 로고
    • VCH: New York
    • Gunterodt, H. J., Wiensendander R., Ed., Scanning Tunnelling Microscopy; Springer Series in Surfactant Science, Springer-Verlag: Berlin 1994; Bonnell, D. A., Ed. Scanning Tunnelling Microscopy and Spectroscopy VCH: New York, 1993.
    • (1993) Scanning Tunnelling Microscopy and Spectroscopy
    • Bonnell, D.A.1
  • 6
    • 33744607543 scopus 로고
    • Tersoff, J.; Hamann, D. R. Phys Rev. B 1985, 31, 805; Magonov, S. N.; Whangbo, M.-H. Adv. Mater. 1994, 6, 355.
    • (1985) Phys Rev. B , vol.31 , pp. 805
    • Tersoff, J.1    Hamann, D.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.