Electronic structure of sulfur-modified nanocrystalline carbon films

Journal of Applied Physics

Volumn 97, Issue 9, 2005, Pages

  Gupta, S ^a   Weiner, B R ^b   Morell, G ^b  

^a MISSOURI STATE UNIVERSITY   (United States)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY OF STATES (DOS); FILM SURFACE; NANOCRYSTALLINE CARBON FILMS; ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPY;

CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; DENSITY (SPECIFIC GRAVITY); DIAMOND LIKE CARBON FILMS; ELECTRIC CONDUCTIVITY; FERMI LEVEL; GRAIN SIZE AND SHAPE; IMAGE ANALYSIS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; SCANNING TUNNELING MICROSCOPY; SULFUR; SURFACE ROUGHNESS;

ELECTRONIC STRUCTURE;

EID: 18844384175     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1888025     Document Type: Article

References (34)

1. D. M. Gruen, Annu. Rev. Mater. Sci. 29, 211 (1999), and references therein.
2. J. Robertson, Surf. Coat. Technol. 50, 185 (1992).
3. J. Robertson, Tribol. Int. 36, 405 (2003).
4. S. Bhattacharyya, Appl. Phys. Lett. 79, 1441 (2001).
5. R. Haubner, S. Bohr, and B. Lux, Diamond Relat. Mater. 8, 171 (1999).
6. S. Gupta, B. L. Weiss, B. R. Weiner, and G. Morell, J. Appl. Phys. 89, 5671 (2001).
7. S. Gupta, B. L. Weiss, B. R. Weiner, and G. Morell, Appl. Phys. Lett. 79, 3446 (2001), and references therein.
8. S. Gupta, B. R. Weiner, and G. Morell, J. Appl. Phys. 91, 10 088 (2002).
9. T. D. Corrigan, A. R. Krauss, D. M. Grüen, O. Auciello, and R. P. H. Chang, Mater. Res. Soc. Symp. Proc. 593, 233 (2000).
10. J. Robertson, J. Vac. Sci. Technol. B 17, 659 (1999);
11. A. Illie, A. C. Ferrari, T. Yagi, and J. Robertson, Appl. Phys. Lett. 76, 2627 (2000).
12. S. Bhattacharyya, K. Walzer, H. Hietschold, and F. Richter, J. Appl. Phys. 89, 1619 (2001).
13. S. Gupta, B. R. Weiner, and G. Morell, J. Appl. Phys. 92, 5457 (2002).
14. M. Werner, R. Job, A. Zaitsev, W. R. Fahrner, W. Seifert, C. Johnston, and P. R. Chalker, Phys. Status Solidi A 154, 385 (1996).
15. R. Kalish, A. Reznik, C. Uzan-Saguy, and C. Cytermann, Appl. Phys. Lett. 76, 757 (2000).
16. T. Miyazaki and H. Okushi, Diamond Relat. Mater. 10, 449 (2001), and references therein.
17. S. Gupta, A. Martinez, B. R. Weiner, and G. Morell, Appl. Phys. Lett. 80, 1471 (2002).
18. J. Robertson and E. P. O'Reily, Phys. Rev. B 35, 2946 (1987).
19. G. Fanchini, S. C. Ray, and A. Tagliaferro, Diamond Relat. Mater. 12, 891 (2003).
20. V. I. Ivanov-Omskii, Pis'ma Zh. Tekh. Fiz. 24, 28 (1998).
21. J. Schafer, Phys. Rev. B 53, 7762 (1996).
22. M. Chhowalla, J. Robertson, C. W. Chen, S. R. P. Silva, C. A. Davis, G. A. J. Amaratunga, and W. I. Milne, J. Appl. Phys. 81, 139 (1997).
23. F. Xiong, Y. Y. Wang, and R. P. H. Chang, Phys. Rev. B 48, 80 106 (1993).
24. C. Arena, B. Kleinsorge, J. Robertson, W. I. Milne, and M. E. Welland, J. Appl. Phys. 85, 1609 (1999).
25. S. Gupta, B. R. Weiner, and G. Morell, J. Appl. Phys. 95, 8314 (2004), and references therein.
26. R. G. Forbes, Solid-State Electron. 45, 779 (2001), and references therein.
27. R. M. Feenstra, J. A. Stroscio, and A. P. Fein, Surf. Sci. 181, 295 (1987);
28. P. Martensson and R. M. Feenstra, Phys. Rev. B 39, 7744 (1989).
29. J. A. Stroscio and R. M. Feenstra, in Scanning Tunneling Microscopy, edited by, J. A. Stroscio, and, W. J. Kaiser, (Academic, New York, 1993), p. 139-140; R. M. Feenstra, Phys. Rev. B 50, 4561 (1994).
30. J. A. Stroscio and R. M. Feenstra, in Scanning Tunneling Microscopy, edited by, J. A. Stroscio, and, W. J. Kaiser, (Academic, New York, 1993), p. 139-140; R. M. Feenstra, Phys. Rev. B 50, 4561 (1994).
31. R. M. Feenstra and J. A. Stroscio, J. Vac. Sci. Technol. B 5, 923 (1987).
32. J. Robertson, Philos. Mag. B 76, 335 (1997).
33. S. Gupta, B. R. Weiner, and G. Morell, Thin Solid Films 455-456, 422 (2004).
34. K. J. Koivusaari, T. T. Rantala, J. Levoska, and S. Leppävuori, Appl. Phys. Lett. 76, 2794 (2000).