Growth and structure of fullerene-like CN x thin films produced by pulsed laser ablation of graphite in nitrogen

Journal of Applied Physics

Volumn 92, Issue 9, 2002, Pages 4980-4988

  Voevodin, A A ^a   Jones, J G ^a   Zabinski, J S ^a   Czigany Zs ^b   Hultman, L ^b  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

BERKOVICH TIP; CN RADICALS; CONDENSATION SURFACE; DEPOSITION CONDITIONS; ELASTIC RECOVERY; FILM COMPOSITION; FILM HARDNESS; FULLERENE FRAGMENT; FULLERENE-LIKE STRUCTURES; HIGH LOAD; INDENTATION CURVE; INDENTATION DEPTH; LASER FLUENCES; LOW PRESSURES; MOLECULAR SPECIES; NANOINDENTATION TESTS; NITROGEN CONTENT; PLASMA CHARACTERISTICS; SOLID FILMS; SUBSTRATE DEFORMATION; SUBSTRATE TEMPERATURE; TIME-DEPENDENT PROCESS; VIBRATIONAL TEMPERATURE;

BRITTLE FRACTURE; CONDENSATION; ELASTICITY; ELASTOMERS; FULLERENES; GRAPHITE; HARDNESS; LASER ABLATION; NANOINDENTATION; NITROGEN; PHOTOELECTRONS; PROTECTIVE COATINGS; RAMAN SPECTROSCOPY; STRUCTURAL OPTIMIZATION; TRANSMISSION ELECTRON MICROSCOPY; UNLOADING; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON FILMS;

EID: 18744413295     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1509106     Document Type: Article

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