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Volumn 38, Issue 10 A, 2005, Pages

In situ grazing incidence x-ray diffraction study of strain evolution during growth and postgrowth annealing of MnAs on GaAs(113)A

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL GROWTH; GRAIN SIZE AND SHAPE; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; STRAIN; X RAY DIFFRACTION;

EID: 18744400239     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/10A/031     Document Type: Article
Times cited : (6)

References (29)
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    • Prinz, G.A.1
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    • Tanaka M 1998 Physica E 2 372
    • (1998) Physica , vol.2 , Issue.1-4 , pp. 372
    • Tanaka, M.1
  • 28
    • 0036493080 scopus 로고    scopus 로고
    • 10.1016/S1386-9477(02)00317-X 1386-9477 E
    • Trampert A 2002 Physica E 13 1119
    • (2002) Physica , vol.13 , Issue.2-4 , pp. 1119
    • Trampert, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.