Thermoelectric effect spectroscopy of deep levels in semi-insulating GaN

Journal of Applied Physics

Volumn 92, Issue 7, 2002, Pages 4126-4128

  Desnica, U V ^a   Pavlovic M ^a   Fang, Z Q ^b   Look, D C ^b  

^a RUDER BO KOVI INSTITUTE   (Croatia)

^b WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL; DEEP TRAPS; ELECTRICAL COMPENSATION; ELECTRON AND HOLE TRAPS; HIGH CONCENTRATION; HIGH RESISTIVITY; MULTIPLE-PEAK; SEMI-INSULATING GAN; THERMALLY STIMULATED CURRENT SPECTROSCOPY; THERMOELECTRIC EFFECT SPECTROSCOPY; TRAP PARAMETERS;

ACTIVATION ENERGY;

GALLIUM NITRIDE;

EID: 18644380922     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1504168     Document Type: Article

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