Tracing deeply buried InAsGaAs quantum dots using atomic force microscopy and wet chemical etching

Applied Physics Letters

Volumn 86, Issue 6, 2005, Pages 1-3

  Fasching, G ^a   Unterrainer, K ^a   Brezna, W ^a   Smoliner, J ^a   Strasser, G ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; FABRICATION; INDIUM COMPOUNDS; SELF ASSEMBLY; SURFACE PROPERTIES;

CLEAVING; DOT EMISSIONS; SELF-ASSEMBLED QUANTUM DOTS; WET CHEMICAL ETCHING;

SEMICONDUCTOR QUANTUM DOTS;

EID: 18644364736     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1862332     Document Type: Article

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