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Volumn 4806, Issue , 2002, Pages 225-232

Nano-scale surface texture by impact of accelerated condensed-gas nanoparticles

Author keywords

Gas cluster ion beam; GCIB; Nanocluster; Nanoparticle

Indexed keywords

ACCELERATION; ARGON; CHEMICAL REACTIONS; CRYSTALLOGRAPHY; ION BEAMS; MOLECULAR ORIENTATION; OPTICAL PROPERTIES; SEMICONDUCTING FILMS; SILICA; SURFACE ROUGHNESS; TEXTURES; VACUUM APPLICATIONS;

EID: 0036425570     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472987     Document Type: Conference Paper
Times cited : (8)

References (15)
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    • Nanoparticle impact micromachining
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  • 9
    • 0036409260 scopus 로고    scopus 로고
    • AFM analysis of gas cluster ion impact craters and smoothing
    • Quebec City, Aug 4-8
    • C. Santeufemio, AFM Analysis of Gas Cluster Ion Impact Craters and Smoothing, abstract accepted for Microscopy and Microanalysis 2002, Quebec City, Aug 4-8, 2002.
    • (2002) Microscopy and Microanalysis 2002
    • Santeufemio, C.1
  • 11
    • 0011266826 scopus 로고    scopus 로고
    • www.epion.com.
  • 15
    • 0011306998 scopus 로고    scopus 로고
    • section 4.2, Dept. of Chemistry, Queen Mary University of London, January
    • R. Nix, An Intro.to Surface Chemistry, http://www.chem.qmw.ac.uk/surfaces/scc/ section 4.2, Dept. of Chemistry, Queen Mary University of London, January 1999.
    • (1999) An Intro.to Surface Chemistry
    • Nix, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.