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Volumn 647, Issue , 2001, Pages
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Simulations and Argon-cluster-ion smoothing of surfaces
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DIFFUSION;
ION BEAMS;
ION BOMBARDMENT;
MATHEMATICAL MODELS;
MICROSCOPIC EXAMINATION;
NANOSTRUCTURED MATERIALS;
SURFACE MEASUREMENT;
SURFACE ROUGHNESS;
ARGON CLUSTER ION BEAM;
CLUSTER SMOOTHING MECHANISM;
CONTINUUM RATE EQUATION;
IMPACT TRANSIENT SURFACE DIFFUSION;
PHENOMENOLOGICAL MODEL;
SURFACE EVOLUTION;
ARGON;
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EID: 16744365723
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (13)
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