SAXS of self-assembled oriented lamellar nano-composite films: An advanced method of evaluation

Journal of Applied Crystallography

Volumn 37, Issue 4, 2004, Pages 575-584

  Ruland, Wilhelm ^a   Smarsly, Bernd ^b,c  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

^b UNIVERSITY OF NEW MEXICO   (United States)

^c MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INORGANIC COMPOUND; ORGANIC COMPOUND;

ARTICLE; CRYSTAL STRUCTURE; CURVE FITTING; EVALUATION; EVAPORATION; FILM; INSTRUMENTATION; MODEL; MOLECULAR INTERACTION; NANOPARTICLE; QUANTITATIVE ANALYSIS; THICKNESS; X RAY CRYSTALLOGRAPHY;

EID: 4043121778     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804011288     Document Type: Article

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