NEXAFS study and electrical properties of nitrogen-incorporated tetrahedral amorphous carbon films

Diamond and Related Materials

Volumn 14, Issue 3-7, 2005, Pages 1057-1061

  McCann, R ^a   Roy, S S ^a   Papakonstantinou, P ^a   Ahmad, I ^a   Maguire, P ^a   McLaughlin, J A ^a   Petaccia, L ^b   Lizzit, S ^b   Goldoni, A ^b  

^a UNIVERSITY OF ULSTER   (United Kingdom)

^b SINCROTRONE TRIESTE   (Italy)

Author keywords

Carbon nitride; Electrical; NEXAFS; Thin film

Indexed keywords

ABSORPTION SPECTROSCOPY; CHEMICAL BONDS; ELECTRIC PROPERTIES; ELECTROCHEMISTRY; ELECTRON TRANSITIONS; NITROGEN; POLARIZATION; THIN FILMS; VACUUM APPLICATIONS;

BONDING CONFIGURATIONS; DOUBLE BONDS; ELECTROCHEMICAL PROPERTIES; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE (NEXAFS);

CARBON NITRIDE;

EID: 18444384261     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2005.01.032     Document Type: Conference Paper

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