Dielectric Function Study on InGaAs Alloy Films

Journal of the Korean Physical Society

Volumn 44, Issue 3 II, 2004, Pages 726-729

  Kim, T J ^a   Ghong, T H ^a   Kim, Y D ^a  

^a Kyung Hee University   (South Korea)

Author keywords

Bruggeman effective medium approximation; Ellipsometry; InGaAs

Indexed keywords

EID: 1842766335     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.44.726     Document Type: Conference Paper

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