Dielectric functions of InxGa1-xAs alloys

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 11, 2003, Pages

  Kim, J ^a,b   Ghong, H ^a   Kim, D ^a   Aspnes, E ^b   Mori, T ^c   Yao, T ^c   Koo, H ^d  

^a Kyung Hee University   (South Korea)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c TOHOKU UNIVERSITY   (Japan)

^d Changwon National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOY; GALLIUM ARSENIDE; INDIUM;

ARTICLE; ELECTRON; ELECTRON DIFFRACTION; ELECTRON TRANSPORT; ENERGY; MATHEMATICAL ANALYSIS; MATHEMATICAL PARAMETERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; TEMPERATURE; X RAY DIFFRACTION;

EID: 0242427707     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.115323     Document Type: Article

References (35)

1. L. Geelhaar, R.A. Bartynski, F. Ren, M. Schnoes, and D.N. Buckley, J. Appl. Phys. 80, 3076 (1996), and references therein.
2. S.R. Johnson, E. Grassi, M. Beaudoin, M.D. Boonzaayer, K.S. Tsakalis, and Y.H. Zhang, J. Vac. Sci. Technol. B. 17, 1237 (1999), and references therein.
3. C. Pickering, R.T. Carline, M.T. Emeny, N.S. Garawal, and L.K. Howard, Appl. Phys. Lett. 60, 2412 (1992).
4. G.Y. Seong, C.Y. Bang, and Y.D. Kim, J. Korean Phys. Soc. 39, S389 (2001).
5. T.J. Kim, Y.S. Ihn, Y.D. Kim, S.J. Kim, D.E. Aspnes, T. Yao, K. Shim, and B.H. Koo, Appl. Phys. Lett. 81, 2367 (2002).
6. D.E. Aspnes and A.A. Studna, Appl. Opt. 14, 220 (1975).
7. P. Lautenschlager, S. Logothetidis, L. Vina, and M. Cardona, Phys. Rev. B. 32, 3811 (1985).
8. S. Logothetidis, M. Alouani, M. Garriga, and M. Cardona, Phys. Rev. B. 41, 2959 (1990).
9. S.M. Kelso, D.E. Aspnes, M.A. Pollack, and R.E. Nahory, Phys. Rev. B. 26, 6669 (1982).
10. M. Schubert, V. Gottschalch, C.M. Herzinger, H. Yao, P.G. Snyder, and J.A. Woollam, J. Appl. Phys. 77, 3416 (1995).
11. S. Adachi, Phys. Rev. B. 35, 7454 (1987).
12. Y.D. Kim, M.V. Klein, S.F. Ren, Y.C. Chang, H. Luo, N. Samarth, and J.K. Furdyna, Phys. Rev. B. 49, 7262 (1994).
13. D.E. Aspnes and A.A. Studna, Phys. Rev. B. 27, 985 (1983).
14. S.G. Choi, Y.D. Kim, S.D. Yoo, D.E. Aspnes, D.H. Woo, and S.H. Kim, J. Appl. Phys. 87, 1287 (2000).
15. Y.D. Kim, S.G. Choi, M.V. Klein, S.D. Yoo, D.E. Aspnes, S.H. Xin, and J.K. Furdyna, Appl. Phys. Lett. 70, 610 (1997).
16. B. Johs, C.M. Herzinger, J.H. Dinan, A. Cornfeld, and J.D. Benson, Thin Solid Films 313, 137 (1998).
17. T.G. Andersson, Z.G. Chen, V.D. Kulakovskii, A. Uddin, and J.T. Vallin, Appl. Phys. Lett. 51, 752 (1987).
18. I.J. Fritz, Appl. Phys. Lett. 51, 1080 (1987).
19. D.E. Aspnes and A.A. Studna, Appl. Phys. Lett. 39, 316 (1981).
20. Y.D. Kim, S.L. Cooper, M.V. Klein, and B.T. Jonker, Appl. Phys. Lett. 62, 2387 (1993).
21. G.E. Jellison, Jr. T.E. Haynes, and H.H. Burke, Opt. Mater. (Amsterdam, Neth.) 2, 105 (1993).
22. F.H. Pollak and M. Cardona, Phys. Rev. 172, 816 (1968).
23. J.A.V. Vechten and T.K. Bergstresser, Phys. Rev. B. 1, 3351 (1970).
24. O. Berolo, J. Woolley, and J.A.V. Vechten, Phys. Rev. B. 8, 3794 (1973).
25. M. Cardona, Modulation Spectroscopy, Suppl. 11 of Solid State Physics, edited by F. Seitz, D. Turnbell, and H. Ehrenreich (Academic, New York, 1969.)
26. D. E. Aspnes, in Handbook on Semiconductors, edited by M. Balkanski (North Holland, Amsterdam, 1980), Vol. 2, p. 109.
27. E.W. Williams and V. Rehn, Phys. Rev. 172, 798 (1968).
28. L. Vina, C. Umbach, M. Cardona, and L. Vodopyanov, Phys. Rev. B. 29, 6752 (1984).
29. A.G. Thompson and J.C. Woolley, Can. J. Phys. 45, 2597 (1967).
30. G. Burns, Solid State Physics (Academic Press Inc., London, 1985), p. 461.
31. H. Yao, P.G. Snyder, and J.A. Woollam, J. Appl. Phys. 70, 3261 (1991), and references therein.
32. F.L. Terry, Jr. J. Appl. Phys. 70, 409 (1991).
33. C.C. Kim, J.W. Garland, and P.M. Raccah, Phys. Rev. B. 47, 1876 (1993).
34. “Guide to Using WVASE32,” Software for Spectroscopic Ellipsometry Data Acquisition and Analysis, J. A. Woollam Co., Inc., 2000.
35. C. M. Herzinger and B. Johs, US Patent No. 5796983, 1998.