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Journal of the Korean Physical Society

Volumn 43, Issue 4 II, 2003, Pages 634-637

Dielectric Functions of Cd1-xMgxTe Alloy Films by Using Spectroscopic Ellipsometry

(5) Ihn, Y S a Kim, T J a Kim, Y D a Aspnes, D E b Kossut, J c

a Kyung Hee University (South Korea)

b NORTH CAROLINA STATE UNIVERSITY (United States)

c INSTITUTE OF PHYSICS (Poland)

Author keywords

Cd 1 xMgxTe ternary alloy films; Optical properties; Spectroscopic ellipsometric measurement

Indexed keywords

EID: 0242361146 PISSN: 03744884 EISSN: None Source Type: Journal
DOI: None Document Type: Conference Paper

Times cited : (8)

References (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.