Accelerated testing and failure of thin-film PV modules

Progress in Photovoltaics: Research and Applications

Volumn 12, Issue 2-3, 2004, Pages 235-248

  McMahon, T J ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Photovoltaics; PV modules; Reliability; Stress; Testing

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; MOISTURE; RELIABILITY; STRESSES; TEMPERATURE; THERMAL CYCLING;

ACCELERATED ENVIRONMENTAL TESTING; PHOTOVOLTAIC MODULE FAILURE; THIN FILM MODULES;

PHOTOVOLTAIC CELLS;

DAMAGE; PHOTOVOLTAIC SYSTEM;

EID: 1842680813     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.526     Document Type: Article

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