Pitfalls of accelerated testing

IEEE Transactions on Reliability

Volumn 47, Issue 2, 1998, Pages 114-118

  Meeker, William Q ^a,b   Escobar, Luis A ^a,b  

^a Iowa State University of Science and Technology   (United States)

^b LOUISIANA STATE UNIVERSITY   (United States)

Author keywords

Arrhenius; Censored data; Degradation; Masked failure mode

Indexed keywords

EXTRAPOLATION; MATHEMATICAL MODELS; STATISTICAL METHODS;

ACCELERATED TESTING;

ACCELERATION MEASUREMENT;

EID: 0032083910     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.722271     Document Type: Article

References (7)

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2. R.A. Evans, "Accelerated testing". IEEE Trans. Reliability, vol 40, 1991 Dec, p 497.
3. R.M. Fischer, W.D. Ketola, W.P. Murray, "Thermal variability in accelerated weathering devices", Progress in Organic Coatings, vol 19, 1991, pp 165-179.
4. J.W. Martin, S.C. Saunders, F.L. Floyd, J.P. Wineburg, "Methodologies for predicting the service lives of coating systems", 1996; Federation of Societies for Coatings Technology, Blue Bell.
5. W.Q. Meeker, L.A. Escobar, Statistical Methods for Reliability Data, 1998; John Wiley & Sons.
6. W. Nelson, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, 1990; John Wiley & Sons.
7. nd ed), 1995, Van Nostrand Reinhold.