Corrosion Effects in Thin-Film Photovoltaic Modules

Progress in Photovoltaics: Research and Applications

Volumn 11, Issue 6, 2003, Pages 377-386

  Carlson, D E ^a   Romero, R ^a   Willing, F ^a   Meakin, D ^a   Gonzalez, L ^a   Murphy, R ^a   Moutinho, H R ^b   Al Jassim, M ^b  

^a BP Solar ^*  (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Corrosion; Delamination; Glass; Photovoltaic modules; Solar cells; Thin film; Transparent conducting oxides

Indexed keywords

CORROSIVE EFFECTS; ELECTRIC POTENTIAL; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL ELECTRODES; ELECTROCHEMISTRY; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); MOISTURE; SOLAR CELLS; THIN FILMS; TIN COMPOUNDS;

HUMID CLIMATE;

PHOTOVOLTAIC CELLS;

DELAMINATION; ELECTROCHEMICAL CORROSION; PHOTOVOLTAIC SYSTEM;

EID: 0141867807     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.500     Document Type: Article

References (9)

1. Fagnan DA, D'Aiello RV, Mongon J. Solarex/Philadelphia Electric amorphous silicon PV test site. Proceedings of 19th IEEE Photovoltaic Specialists Conference 1987; 1508-1509.
2. Carlson DE, Wagner S. Amorphous silicon photovoltaic systems. In Renewable Energy, Sources for Fuels and Electricity, Johansson TB, Kelly H, Reddy AKN, Williams RH (eds). Island Press: Washington, DC, 1992; 403-435.
3. 2:F transparent conducting layers in thin film photovoltaic modules. Solar Energy Materials and Solar Cells 2003; (in press).
4. Arya RR, Carlson DE. Amorphous silicon PV module manufacturing at BP Solar. Progress in Photovoltaics: Research and Applications 2002; 10(2): 69-76.
5. Carlson DE. Ion depletion of glass at a blocking aniode: I, theory and experimental results for alkali silicate glasses. Journal of the American Ceramic Society 1974; 57(7): 291-294.
6. Doremus RH. Glass Science. Wiley: New York, 1994; 227-229.
7. Schade H, Smith Z, Thomas J, Catalano A. Hydrogen plasma interactions with tin oxide surfaces. Thin Solid Films 1984; 117: 149-153.
8. Kumar S, Drevillon J. A real time ellipsometry study of the growth of amorphous silicon on transparent conducting oxides. Journal of Applied Physics 1989; 65(8): 3023-3034.
9. Jansen KW, Delahoy AE. A laboratory technique for the evaluation of electrochemical transparent conductive oxide delamination from glass substrates. Thin Solid Films 2003; 423: 153-160.