Extraction of individual-cell photocurrents and shunt resistances in encapsulated modules using large-scale laser scanning

Progress in Photovoltaics: Research and Applications

Volumn 4, Issue 1, 1996, Pages 63-75

  Eisgruber, I L ^a   Sites, J R ^a  

^a Department of Environmental and Radiological Health Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; INDUCED CURRENTS; LASER APPLICATIONS; SCANNING; SPURIOUS SIGNAL NOISE; THIN FILM DEVICES;

OPTICAL BEAM INDUCED CURRENT; PHOTOCURRENTS; SHUNT RESISTANCE;

SOLAR CELLS;

EID: 0029756720     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-159X(199601/02)4:1<63::AID-PIP112>3.0.CO;2-R     Document Type: Article

References (9)

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