Electromigration in thin-film photovoltaic module metallization systems

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 1, Issue , 1988, Pages 364-369

  Wen, L ^a   Mon, G ^a   Jetter, E ^a   Ross Jr , R ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM AND ALLOYS; SEMICONDUCTOR MATERIALS--THIN FILMS;

ELECTROMIGRATION; OPEN CIRCUIT FAILURES;

PHOTOVOLTAIC CELLS;

EID: 0024187679     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)