Model catalyst studies on vanadia particles deposited onto a thin-film alumina support - 1. Structural characterization

Journal of Physical Chemistry B

Volumn 106, Issue 34, 2002, Pages 8756-8761

  Magg, Norbert ^a   Giorgi, Javier B ^a   Schroeder, Thomas ^a   Bäumer, Marcus ^a   Freund, Hans Joachim ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED REFLECTION-ABSORPTION SPECTROSCOPY (IRAS);

ABSORPTION SPECTROSCOPY; ALUMINA; CATALYSTS; ELECTRONIC PROPERTIES; EVAPORATION; LIGHT ABSORPTION; NICKEL COMPOUNDS; PARTICLES (PARTICULATE MATTER); SCANNING TUNNELING MICROSCOPY; THIN FILMS; ULTRAHIGH VACUUM; X RAY PHOTOELECTRON SPECTROSCOPY;

VANADIUM COMPOUNDS;

EID: 0037194611     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0204556     Document Type: Article

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