Strong relaxations at the Cr2O3(0001) surface as determined via low-energy electron diffraction and molecular dynamics simulations

Surface Science

Volumn 372, Issue 1-3, 1997, Pages

  Rohr, F ^a   Baumer M ^a   Freund, H J ^a   Mejias, J A ^b   Staemmler, V ^b   Muller S ^c   Hammer, L ^c   Heinz, K ^c  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b RUHR UNIVERSITY BOCHUM   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Chromium; Diffraction; Electron solid interactions; Insulating surfaces; Low energy electron diffraction (LEED); Morphology; Roughness; Scattering; Surface energy; Surface structure; Topography

Indexed keywords

ATOMS; INTERFACIAL ENERGY; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR DYNAMICS; MORPHOLOGY; OXYGEN; RELAXATION PROCESSES; SIMULATION; SURFACE ROUGHNESS; SURFACE STRUCTURE;

DEPOLARIZATION; INTERLAYER RELAXATIONS; SURFACE POTENTIALS;

CHROMIUM COMPOUNDS;

EID: 0031075471     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01255-1     Document Type: Article

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