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Volumn 437, Issue 1, 1999, Pages 38-48
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Vanadium oxides thin films grown on rutile TiO2(110)-(1 × 1) and (1 × 2) surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
ELECTRON ENERGY LEVELS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
EVAPORATION;
HIGH RESOLUTION ELECTRON MICROSCOPY;
INTERFACES (MATERIALS);
LOW ENERGY ELECTRON DIFFRACTION;
SURFACE STRUCTURE;
SURFACES;
THIN FILMS;
TITANIUM DIOXIDE;
X RAY PHOTOELECTRON SPECTROSCOPY;
METAL INSULATOR SURFACE;
VACUUM SURFACE ANALYTICAL TECHNIQUES;
VANADIUM OXIDES;
X RAY INDUCED VALENCE BAND;
VANADIUM COMPOUNDS;
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EID: 0033362838
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(99)00674-3 Document Type: Article |
Times cited : (62)
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References (42)
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