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Volumn 437, Issue 1, 1999, Pages 38-48

Vanadium oxides thin films grown on rutile TiO2(110)-(1 × 1) and (1 × 2) surfaces

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; EVAPORATION; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; SURFACES; THIN FILMS; TITANIUM DIOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0033362838     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00674-3     Document Type: Article
Times cited : (62)

References (42)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.