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Volumn 374, Issue 2, 2003, Pages 161-166

Thermal Characterization and Optimization of Active System IPEM

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; ELECTRIC CONVERTERS; FINITE ELEMENT METHOD; INTEGRATION; MESFET DEVICES; MICROPROCESSOR CHIPS; OPTIMIZATION; PACKAGING; SEMICONDUCTING GALLIUM ARSENIDE; SILICON CARBIDE;

EID: 1842482967     PISSN: 02725673     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2003-41415     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 2
    • 0035746657 scopus 로고    scopus 로고
    • Comparative Thermal Characterizations of GaAs and SiC Devices
    • Mittereder, J. A., Andersen, W. T., Buot, F. A., and Ioannou, D. E., 2001, "Comparative Thermal Characterizations of GaAs and SiC Devices," JEDEC, pp. 3-11.
    • (2001) JEDEC , pp. 3-11
    • Mittereder, J.A.1    Andersen, W.T.2    Buot, F.A.3    Ioannou, D.E.4
  • 10
    • 84885270806 scopus 로고    scopus 로고
    • Engineous Software, Cary, NC
    • iSight, version 5.0, Engineous Software, Cary, NC.
    • iSight, Version 5.0


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.