Comparative thermal characterizations of GaAs and SiC devices

GaAs Reliability Workshop, Proceedings

Volumn , Issue , 2001, Pages 3-11

  Mittereder, J A ^a   Anderson, W T ^a   Buot, Felix A ^a   Ioannou, D E ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FINITE ELEMENT METHOD; GATES (TRANSISTOR); INFRARED IMAGING; MESFET DEVICES; OPTICAL RESOLVING POWER; SEMICONDUCTING GALLIUM ARSENIDE; SILICON CARBIDE; THERMAL CONDUCTIVITY; THERMAL EFFECTS;

HEAT SPREADING EFFECTS; INFRARED (IR) THERMAL MICROSCOPES;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0035746657     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)